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Circuit Testing

IC Socket Hi-Giga Socket LTCC Applied Devices Probe Card Probe Card for RF Testing IC Test Unit Ring/DUT I/F Block

IC Socket

  • BGA/QFP/QFN
  • Kelvin Socket for High Current

IC Socket

Kelvin Probe

Hi-Giga Socket

  • Frequency:16GHz
  • Min. pitch:300μm

Insulator Ring Type

Plastic Sandwich Type

IC Test Unit Ring / DUT I/F Block

  • Frequency:5GHz
  • Low tuned Spring Force

IC Test Unit Ring

DUT I/F Block

Probe Card for RF Testing

  • Vertical Probe Type:Area Array / 12GHz
  • YP4 Probe Type:Al Peripheral / 10GHz

Vertical Probe Type

YP4 Probe Type

Interposer Substrate

Flexible Substrate

Probe Card

  • Vertical Probe Type:Area Array / Min. pitch 100μm
  • YP4 Probe Type:Al Peripheral / Min.pitch 30μm

Vertical Probe Type

YP4 Probe Type