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RF Probe-test Solution up to 110GHz

YOKOWO CO.,LTD. plans to provide the total RF probe-test solution from DC up to EHF band. Recently, higher frequency RF test requirements are increasing rapidly based on the development of high speed semiconductor devices. 67GHz VNA with 500GHz or 1THz extenders are already commercially available. To cope with these measurement equipments’ advancements, YOKOWO decided to provide new RF probe-test solutions for our customers. Our first stage products line-up is up to 110GHz use, however, our second stage is up to 325GHz, and future goal is 1THz measurement.
Our products line-ups are probe units (coaxial type or waveguide type) which directly contact on the test wafer die, ISS (Impedance Standard Substrate) and novel semi-flex waveguide with converters, thus offering the total test solution bridging from testing die to extender/VNA. We are also planning to provide coaxial cables in future to consolidate the position as a total solution supplier.

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PENPROBE.CA

30 degree

45 degree

Impedance Standard Substrate (ISS)

UVULALINE

UVULALINE - Waveguide Converter

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Technical Information Contact R & D Division
TEL: +81-3-3916-3173
Ordering Contact DS Division
TEL: +81-3-3916-3141